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Thin Film Optical Metrology Software (Ellipsometry, Reflectance, Transmittance) for R&D and production. The main product is TFCompanion, a software application for thin film analysis and metrology. Includes analytical tools for interpretation of measurement data. Available for all operating systems with JVM support (Windows, Apple, Unix).
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http://www.semiconsoft.com/
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| Description: |
Science, Physics, Optics, Software - Semiconsoft. Thin Film Optical Metrology Software (Ellipsometry, Reflectance, Transmittance) for R&D and production. |
| Specialized in: |
Semiconductor
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Software
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Test Equipment
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Photometrics
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Rudolph
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Data Storage
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Cd
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Cd-r
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Cd-rw
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Dvd
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Filter
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Glass
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Oxide
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Photoresist
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Arc
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Organic
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Polymer
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Dlc
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Ito
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Metal
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