| |
 |
Category List - Main » Science » Technology » Metrology |
 |
|
New Sites - Main » Science » Technology » Metrology » Products and Services |
|
|
Aystorm Scientific Ltd. (2nd April, 2011) : Materials characterisation & surface analysis services. Specialising in ion beam analysis including SIMS, ule SIMS, Auger, XPS, RBS, TEM and surface contamination (TOF SIMS, VPD-TXRF, VPD-ICPMS). Consultancy in various aspects of thin films and nano layerssemiconductor ... |
|
Dacell Co., Ltd. (27th April, 2005) : Manufactures load cell, torque sensor, pressure sensor, torque wrench, LVDT, multi-layer inclinometer and digital indicator in Chung-Buk, Korea. |
|
Alpha Moisture Systems (27th April, 2005) : Manufacture dewpoint meters, hygrometers and analyzers for the measurement of trace water in gases and dry compressed air, encompassing an overall range from +20C to -110C. Based in Bradford, England. |
|
Axic, Inc. (27th April, 2005) : Manufactures and distributes semiconductor plasma processing equipment and thin film metrology tools for the semiconductor, III-V compound semiconductor, optics, photonics, optoelectronics, nanotechnology and micro electromechanical system (MEMS) industries ... |
|
Physical Electronics, Inc. (27th April, 2005) : Surface analysis instrumentation, including: AES, ESCA, TOF-SIMS and D-SIMS based instrumentation. |
|
Top Sites - Main » Science » Technology » Metrology » Products and Services |
|
Dacell Co., Ltd. ( ) : Manufactures load cell, torque sensor, pressure sensor, torque wrench, LVDT, multi-layer inclinometer and digital indicator in Chung-Buk, Korea.
|
|
Microbac Laboratories, Inc. () : Operates a network of laboratories capable of providing contract research, biological and chemical analyses on food, pharmaceuticals, and environmental samples, throughout the USA, from headquarters in Wexford, Pennsylvania.
|
|
Aystorm Scientific Ltd. () : Materials characterisation & surface analysis services. Specialising in ion beam analysis including SIMS, ule SIMS, Auger, XPS, RBS, TEM and surface contamination (TOF SIMS, VPD-TXRF, VPD-ICPMS). Consultancy in various aspects of thin films and nano layerssemiconductor
|
|
Industrial Testing Laboratories Inc. () : Offers instrumental, wastewater, chemical pharmaceutical analysis, mechanical testing, failure investigation, metallurgical testing, litigation support, problem solving, deformulation, non-destructive testing, material identification from Maryland Heights,MO
|
|
Delft Solids Solutions BV. () : Offering measurement of porosity by adsorption isotherms of inert gases (physisorption) and reactive gases (chemisorption) or mercury porosimetry and helium pycnometry. Sample submission to Delft, The Netherlands.
|
|
|
|
